Introduction

Cementless devices can be designed with varying surface treatments with the hope of achieving osseointegration. The surface finish dictates the interaction, adhesion and growth of bone therefore it is an important parameter that be measured and compared. The surface topography of a material can be viewed both microscopically and macroscopically. Surface microtopography focuses on the peaks and valleys where deviations in the characteristics of the size and spacing of these features determine the variability between surface topography. The most common parameter used worldwide to describe surface roughness is the arithmetic average height (Ra). The definition of Ra is the absolute deviation of the surface irregularities from a mean line across the sampling length given by the equation shown in figure 1.

Many techniques can be used to relate to surface characteristics of materials, with the common two options revolving around contact and non-contact methods. These techniques are expensive and are limited in detecting the interaction of implantable devices at a macroscopic level. This study sought to develop a method to determine the surface roughness and characterise implants based on cross sectional images and scanning electron microscopy.